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Critical values and test direction

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A critical value is a cutoff from a reference distribution for a specified test, degrees of freedom, significance level, and direction. There is no universal rule that a larger raw test statistic is always significant.

For a two-sided t-test, compare |t| with the appropriate upper positive critical value; a lower-tailed test uses a negative cutoff. F and many chi-square tests use an upper tail. Prefer verified software output with the method and assumptions documented.

References: NIST two-sample t-test